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Product Highlights
The Model 7072 Semiconductor Matrix Card is designed specifically to handle low-level and high-impedance measurements encountered in semiconductor parametric tests on wafers and devices. This unique design provides two low-current circuits with specified 1pA maximum offset current for sensitive sub-picoamp measurement resolution and two C-V paths for measurement of Capacitance Voltage characteristics from DC to 1MHz. Four additional high-quality signal paths with
- Two 1300V, sub-picoamp current paths
- Six 200V, 20pA paths
- For use with Model 2410 and Model 237 SMU
- 3-lug triaxial connections
- Compatible with Models 707A, 707B, 708A, and 708B
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